A microraman study of the structural properties of PLD high Tc superconducting thin films

Physica C: Superconductivity and its Applications

Volumn 270, Issue 1-2, 1996, Pages 144-154

  Martinez O ^a   Jimenez J ^a   Martin P ^a   Prieto, A C ^a   Degoy, S ^b   Chambonnet, D ^b   Belouet, C ^b   Nicoletti, S ^c   Correra, L ^c  

^a UNIVERSIDAD DE VALLADOLID   (Spain)

^b NOKIA RESEARCH CENTER   (United States)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; OXIDE SUPERCONDUCTORS; PHYSICAL PROPERTIES; PULSED LASER APPLICATIONS; RAMAN SPECTROSCOPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; X RAY DIFFRACTION;

HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS; MICRORAMAN SPECTROSCOPY; PULSED LASER DEPOSITION; STRUCTURAL PROPERTIES;

SUPERCONDUCTING FILMS;

EID: 0030264041     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(96)00478-9     Document Type: Article

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