Epitaxial growth modes and interlayer relaxation of thin Cu films grown on Ru(0001) and oxygen-precovered Ru(0001)

Surface Science

Volumn 387, Issue 1-3, 1997, Pages

  Ruebush, S D ^a   Couch, R E ^a   Thevuthasan, S ^b   Wang, Z ^a,c   Fadley, C S ^a,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Copper; Electron solid interactions, scattering, diffraction; Epitaxy; Growth; Metallic surfaces; Oxygen; Photoelectron spectroscopy; Ruthenium; Single crystal surfaces

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; GAS ADSORPTION; METALLIC FILMS; OXYGEN; RELAXATION PROCESSES; RUTHENIUM; SURFACE PHENOMENA; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERLAYER RELAXATION;

COPPER;

EID: 0031560020     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00429-9     Document Type: Article

References (28)

1. E. Bauer, Appl. Surf. Sci. 11-12 (1982) 479.
2. G. Potschke, J. Schroder, C. Guenther, R.Q. Hwang, R.J. Behm, Surf. Sci. 252 (1991) 592; G.Q. Potschke, R.J. Behm, Phys. Rev. B 44 1442 (1991); C. Guenther, J. Vrijmoeth, R.Q. Hwang, R.J. Behm, PRL 74 (1995) 754.
3. G. Potschke, J. Schroder, C. Guenther, R.Q. Hwang, R.J. Behm, Surf. Sci. 252 (1991) 592; G.Q. Potschke, R.J. Behm, Phys. Rev. B 44 1442 (1991); C. Guenther, J. Vrijmoeth, R.Q. Hwang, R.J. Behm, PRL 74 (1995) 754.
4. G. Potschke, J. Schroder, C. Guenther, R.Q. Hwang, R.J. Behm, Surf. Sci. 252 (1991) 592; G.Q. Potschke, R.J. Behm, Phys. Rev. B 44 1442 (1991); C. Guenther, J. Vrijmoeth, R.Q. Hwang, R.J. Behm, PRL 74 (1995) 754.
5. C. Guenther, Ph.D. thesis, University of Munich, 1994.
6. J.C. Hamilton, S.M. Foiles, Phys. Rev. Lett. 75 (1995) 882.
7. K. Christmann, G. Ertl, H. Shimizu, Thin Solid Films 57 (1979) 247; J. Catal. 61 (1980) 397.
8. K. Christmann, G. Ertl, H. Shimizu, Thin Solid Films 57 (1979) 247; J. Catal. 61 (1980) 397.
9. J.E. Houston, C.H.F. Peden, D.S. Blair, D.W. Goodman, Surf. Sci. 167 (1986) 427; J.E. Houston, C.H.F. Peden, Peter J. Feibelman, Phys. Rev. Lett. 56 (1986) 375; D.G. O'Neill, J.E. Houston, Phys. Rev. B 42 (1990) 2792.
10. J.E. Houston, C.H.F. Peden, D.S. Blair, D.W. Goodman, Surf. Sci. 167 (1986) 427; J.E. Houston, C.H.F. Peden, Peter J. Feibelman, Phys. Rev. Lett. 56 (1986) 375; D.G. O'Neill, J.E. Houston, Phys. Rev. B 42 (1990) 2792.
11. J.E. Houston, C.H.F. Peden, D.S. Blair, D.W. Goodman, Surf. Sci. 167 (1986) 427; J.E. Houston, C.H.F. Peden, Peter J. Feibelman, Phys. Rev. Lett. 56 (1986) 375; D.G. O'Neill, J.E. Houston, Phys. Rev. B 42 (1990) 2792.
12. C. Park, E. Bauer, H. Poppa, Surf. Sci. 187 (1987) 86.
13. K. Kalki, M. Schick, G. Ceballos, K. Wandelt, Thin Solid Films 228 (1993) 36.
14. H. Wolter, M. Schmidt, K. Wandelt, Surf. Sci. 298 (1993) 173.
15. M. Schmidt, H. Wolter, M. Nohlen, K. Wandelt, J. Vac. Sci. Technol. A 12 (1994) 1818.
16. C.S. Fadley, Prog. Surf. Sci. 16 (1984) 275; C.S. Fadley, in: R.Z. Bachrach (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Plenum Press, New York, 1992, p. 421; C.S. Fadley, Surf. Sci. Rep. 19 (1993) 231; A.P. Kaduwela, D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 57 (1991) 223.
17. C.S. Fadley, Prog. Surf. Sci. 16 (1984) 275; C.S. Fadley, in: R.Z. Bachrach (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Plenum Press, New York, 1992, p. 421; C.S. Fadley, Surf. Sci. Rep. 19 (1993) 231; A.P. Kaduwela, D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 57 (1991) 223.
18. C.S. Fadley, Prog. Surf. Sci. 16 (1984) 275; C.S. Fadley, in: R.Z. Bachrach (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Plenum Press, New York, 1992, p. 421; C.S. Fadley, Surf. Sci. Rep. 19 (1993) 231; A.P. Kaduwela, D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 57 (1991) 223.
19. C.S. Fadley, Prog. Surf. Sci. 16 (1984) 275; C.S. Fadley, in: R.Z. Bachrach (Ed.), Synchrotron Radiation Research: Advances in Surface and Interface Science, Plenum Press, New York, 1992, p. 421; C.S. Fadley, Surf. Sci. Rep. 19 (1993) 231; A.P. Kaduwela, D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 57 (1991) 223.
20. J.J. Rehr, R.C. Albers, Phys. Rev. B 41 (3990) 8139.
21. D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 48 (1990) 689; A.P. Kaduwela, G.S. Herman, D.J. Friedman, C.S. Fadley, J.J. Rehr, Phys. Scr. 41 (1990) 948.
22. D.J. Friedman, C.S. Fadley, J. Electron Spectrosc. Relat. Phenom. 48 (1990) 689; A.P. Kaduwela, G.S. Herman, D.J. Friedman, C.S. Fadley, J.J. Rehr, Phys. Scr. 41 (1990) 948.
23. R.S. Saiki, A.P. Kaduwela, M. Sagurton, J. Osterwalder, D.J. Friedman, C.S. Fadley, C.R. Brundle, Surf. Sci. 282 (1993) 33.
24. Y.G. Shen, D.J. O'Connor, J. Yao, H. van Zee, R.H. Roberts, R.J. MacDonald, K. Wandelt, J. Vac. Sci. Technol. A 13 (1995) 1478.
25. P.J. Feibelman, J.E. Houston, H.L. Davis, D.G. O'Neill, Surf. Sci. 302 (1994) 81.
26. Y.G. Shen, D.J. O'Connor, H. van Zee, K. Wandelt, R.J. MacDonald, Thin Solid Films 263 (1995) 72.
27. T.E. Gallon, Surf. Sci. 17 (1969) 486.
28. C.M. Schneider, A.K. Schmid, P. Schuster, H.P. Oepen, J. Kirschner, in: R.F.C. Farrow et al. (Eds.), Magnetism and Structure in Systems of Reduced Dimensions, Plenum, New York, 1993, p. 453.