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Volumn 72, Issue 9, 1998, Pages 1104-1106

Comparison of morphology of CdTe/CdMnTe interfaces in heterostructures grown by molecular beam epitaxy in a standard and atomic layer modes

(6) Godlewski, M a Wojtowicz, T a Karczewski, G a Kossut, J a Bergman, J P b Monemar, B b

a INSTITUTE OF PHYSICS (Poland)

b LINKÖPING UNIVERSITY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MORPHOLOGY; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

ATOMIC LAYER EPITAXY; CADMIUM MANGANESE TELLURIDE; CADMIUM TELLURIDE; EXCITON MIGRATION;

HETEROJUNCTIONS;

EID: 0032473298 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.120937 Document Type: Review

Times cited : (5)

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