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Volumn 72, Issue 5, 1998, Pages 602-604

High-Tc direct current SQUIDs on silicon bicrystal substrates operating at 77 K

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; EPITAXIAL GROWTH; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; JOSEPHSON JUNCTION DEVICES; LASER APPLICATIONS; MATHEMATICAL MODELS; SIGNAL NOISE MEASUREMENT; SILICON; TRANSFER FUNCTIONS; WHITE NOISE;

EID: 0032472694     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120819     Document Type: Article
Times cited : (18)

References (13)
  • 4
    • 21544480618 scopus 로고    scopus 로고
    • CrysTec GmbH, Köpeniker Str. 325, D-12555Berlin, Germany
    • CrysTec GmbH, Köpeniker Str. 325, D-12555Berlin, Germany.
  • 8
    • 21544477300 scopus 로고    scopus 로고
    • HTSED Workshop'97, May 28-30, Matsuyama, Japan
    • P. Seidel, S. Linzen, F. Schmidl, HTSED Workshop'97, May 28-30, Matsuyama, Japan, Proc. FED 157, 178 (1997).
    • (1997) Proc. FED , vol.157 , pp. 178
    • Seidel, P.1    Linzen, S.2    Schmidl, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.