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Volumn 72, Issue 5, 1998, Pages 602-604
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High-Tc direct current SQUIDs on silicon bicrystal substrates operating at 77 K
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC RESISTANCE;
EPITAXIAL GROWTH;
GRAIN BOUNDARIES;
HIGH TEMPERATURE SUPERCONDUCTORS;
JOSEPHSON JUNCTION DEVICES;
LASER APPLICATIONS;
MATHEMATICAL MODELS;
SIGNAL NOISE MEASUREMENT;
SILICON;
TRANSFER FUNCTIONS;
WHITE NOISE;
ION BEAM ETCHING;
LASER PATTERNING;
SILICON BICRYSTAL SUBSTRATES;
SQUIDS;
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EID: 0032472694
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120819 Document Type: Article |
Times cited : (18)
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References (13)
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