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Volumn 135, Issue 1-4, 1998, Pages 175-183

Subthreshold radiation-induced processes in the bulk and on surfaces and interfaces of solids

Author keywords

Crystallization; Defect formation; Electronic excitation; Interfaces; Knock on; Material modification; Radiation damage; Self trapped excitons; Sputtering; Subthreshold effects; Surfaces

Indexed keywords

CHEMICAL BONDS; CRYSTALLIZATION; ELECTRON TRANSITIONS; EXCITONS; INTERFACES (MATERIALS); SPUTTERING; SURFACE TREATMENT;

EID: 0032472627     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00523-5     Document Type: Article
Times cited : (37)

References (49)
  • 15
    • 0001486737 scopus 로고
    • F. Seitz, J.S. Koehler (Eds.), Academic Press, New York
    • F. Seitz, J.S. Koehler, in: F. Seitz, J.S. Koehler (Eds.), Solid State Physics, Academic Press, New York, 1956, p. 305.
    • (1956) Solid State Physics , pp. 305
    • Seitz, F.1    Koehler, J.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.