Selective laser removal of the dimer layer from Si(100) surfaces revealed by scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 8, 1996, Pages R4245-R4248

  Xu, Jun ^a   Overbury, S ^a   Wendelken, J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3042882150     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.R4245     Document Type: Article

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