Direct atomic observation of Ge/(001)Si interfaces by image processing methods in high-resolution electron microscopy

Journal of Electron Microscopy

Volumn 47, Issue 6, 1998, Pages 581-589

  Hu, J J ^a   Tanaka, N ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Coma free alignment; Crystal structure; Ge (001)Si interface; High resolution electron microscopy; Image processing

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; INFORMATION FILTERING; LENSES; OPTICAL DATA PROCESSING;

COMA-FREE ALIGNMENT; CRYSTALS STRUCTURES; DIGITAL IMAGE PROCESSING TECHNIQUE; DIRECT OBSERVATIONS; GE/(001)SI INTERFACE; IMAGE PROCESSING - METHODS; IMAGES PROCESSING; OBJECTIVE LENS; OPTICAL FOURIER-TRANSFORM; REAL- TIME;

ALIGNMENT;

EID: 0032408678     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023631     Document Type: Article

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