Structural and chemical analysis of grain boundaries and tellurium precipitates in commercial Cd1-xZnxTe

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3446, Issue , 1998, Pages 49-54

  Heffelfinger, J R ^a   Medlin, D L ^a   James, R B ^a  

^a Hutchinson Technology Incorporated   (United States)

Author keywords

Cadmium zinc telluride; CZT; Electron microscopy; Radiation detector materials; Tellurium precipitates

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; INFRARED RADIATION; OPTICAL MICROSCOPY; PHASE INTERFACES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING TELLURIUM; TRANSMISSION ELECTRON MICROSCOPY;

CADMIUM ZINC TELLURIDE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INFRARED-LIGHT SPECTROSCOPY; PRECIPITATES; SELECTED-AREA ELECTRON DIFRACTION; VISIBLE-LIGHT MICROSCOPY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032404557     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312902     Document Type: Conference Paper

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