Intercomparisons of reflectance measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 10-15

  Barnes, P Yvonne ^a   Early, Edward A ^a   Johnson, B Carol ^a   Butler, James J ^a   Bruegge, Carol J ^a   Biggar, Stuart ^a   Spyak, Paul R ^a   Pavlov, Milutin ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Aluminum; Bidirectional reflectance distribution function; Comparison; Diffuse reflectance; Polytetrafluoroethylene; Reflectance; Reflectance factor; Spectralon

Indexed keywords

ALUMINUM; DATA REDUCTION; DIFFUSION; ETHYLENE; REMOTE SENSING;

DIFFUSE REFLECTANCE;

LIGHT REFLECTION;

EID: 0032403724     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326663     Document Type: Conference Paper

References (11)

1. Initial results of the bidirectional reflectance characterization round-robin in support of EOS
2. BRDF round robin
3. NIST high accuracy reference reflectometer-spectrophotometer
4. Geometrical considerations and nomenclature for reflectance
5. Standard practice for angle resolved optical scatter measurements on specular or diffuse surfaces
6. Directional reflectance characterization facility and measurement methodology
7. Design review of a high accuracy UV to near IR scatterometer
8. Polarimetry and scatterometry using a wollaston polarimeter
9. Laboratory calibration of field reflectance panels