Initial results of the bidirectional reflectance characterization round-robin in support of EOS

Metrologia

Volumn 35, Issue 4, 1998, Pages 609-613

  Johnson, B Carol ^a   Barnes, P Y ^a   O'Brian, T R ^a   Butler, J J ^b   Bruegge, C J ^c   Biggar, S ^d   Spyak, P R ^d   Pavlov, M M ^e  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^d UNIVERSITY OF ARIZONA   (United States)

^e Hughes Santa Barbara Remote Sensing   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001425580     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/66     Document Type: Article

References (16)

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11. ASTM E1392-90, Standard Practice for Angle Resolved Optical Scatter Measurements on Specular or Diffuse Surfaces, In Annual Book of ASTM Standards, Vol. 10.05: Electrical Insulation and Electronics, 1997, American Society for Testing and Materials, West Conshohocken, Pennsylvania, 1-10.
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