Ballistic electron emission microscopy studies on Au/CaF2/n-Si(111) heterostructures

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 4, 1998, Pages 2653-2662

  Sumiya, Touru ^a   Miura, Tadao ^a   Tanaka, Shun Ichiro ^a  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032349465     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581396     Document Type: Article

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