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Volumn 51, Issue 4, 1998, Pages 525-530
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Syntheses and optical properties of low-temperature SiOx and TiOx thin films prepared by plasma enhanced CVD
a a a a a a
a
Shincron Co Ltd
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
INFRARED RADIATION;
LIGHT EXTINCTION;
MAGNETIC FIELD EFFECTS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
REFRACTIVE INDEX;
SILANES;
STOICHIOMETRY;
SYNTHESIS (CHEMICAL);
THIN FILMS;
TITANIUM OXIDES;
ETHYLTRIMETHYLSILANE;
EXTINCTION COEFFICIENT;
SILICON OXIDE;
TETRAETHOXYSILANE;
TITANIUMTETRAISOPROPOXIDE;
DIELECTRIC FILMS;
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EID: 0032319436
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/s0042-207x(98)00246-2 Document Type: Article |
Times cited : (20)
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References (9)
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