Total-dose radiation-hard diamond-based hydrogen sensor

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2799-2804

  Kerns, D V ^a   Kang, W P ^a   Davidson, J L ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIAMOND FILMS; HYDROGEN; IONIZING RADIATION; MIS DEVICES; RADIATION HARDENING; SEMICONDUCTING DIAMONDS;

MIS HYDROGEN SENSORS; RADIATION HARDNESS;

CHEMICAL SENSORS;

EID: 0032318035     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736530     Document Type: Article

References (13)

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