Sequential test generators: Past, present and future

Integration, the VLSI Journal

Volumn 26, Issue 1-2, 1998, Pages 41-54

  Kim, Yong Chang ^a   Saluja, Kewal K ^a  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

Automatic test pattern generation; Sequential circuit test generation; Structure based testing; Test generation algorithms

Indexed keywords

ALGORITHMS; AUTOMATA THEORY; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT TESTING; SEQUENTIAL CIRCUITS;

AUTOMATIC TEST PATTERN GENERATION (ATPG); SEQUENTIAL CIRCUIT TEST GENERATION ALGORITHMS;

VLSI CIRCUITS;

EID: 0032307319     PISSN: 01679260     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0167-9260(98)00020-0     Document Type: Article

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