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Volumn 159, Issue 1-4, 1996, Pages 144-147
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Optimization of the structural and optical properties of ZnS epilayers grown on (100) GaAs by MOVPE
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CRYSTAL STRUCTURE;
METALLORGANIC VAPOR PHASE EPITAXY;
OPTICAL PROPERTIES;
OPTIMIZATION;
PHOTOLUMINESCENCE;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING ZINC COMPOUNDS;
SEMICONDUCTOR GROWTH;
STOICHIOMETRY;
SURFACE TREATMENT;
CHANNELING RUTHERFORD BACKSCATTERING SPECTROSCOPY;
CRYSTALLINE QUALITY;
OPTICAL QUALITY;
PRECURSOR VAPOR PHASE STOICHIOMETRY;
SEMICONDUCTING ZINC SULFIDE EPILAYER;
SEMICONDUCTING FILMS;
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EID: 0030562218
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-0248(95)00859-4 Document Type: Article |
Times cited : (12)
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References (9)
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