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Volumn 37, Issue 12, 1998, Pages 6544-6551

Al-Cu texture enhancement by underlayer texture

Author keywords

Al; Electromigration; Texture; Thin films

Indexed keywords

ALUMINUM ALLOYS; CRYSTAL ORIENTATION; ELECTROMIGRATION; FILM GROWTH; GRAIN GROWTH; NUCLEATION; TEXTURES;

EID: 0032303320     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.6544     Document Type: Article
Times cited : (11)

References (24)
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.