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Volumn 37, Issue 12, 1998, Pages 6544-6551
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Al-Cu texture enhancement by underlayer texture
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Author keywords
Al; Electromigration; Texture; Thin films
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Indexed keywords
ALUMINUM ALLOYS;
CRYSTAL ORIENTATION;
ELECTROMIGRATION;
FILM GROWTH;
GRAIN GROWTH;
NUCLEATION;
TEXTURES;
FULL WIDTH AT HALF MAXIMUM (FWHM);
METALLIC FILMS;
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EID: 0032303320
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.6544 Document Type: Article |
Times cited : (11)
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References (24)
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