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Volumn 14, Issue 2, 1996, Pages 346-351

Development of 111 texture in Al films grown on SiO2/Si(001) by ultrahigh-vacuum primary-ion deposition

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; GRAIN SIZE AND SHAPE; IRRADIATION; METALLIC FILMS; RADIATION EFFECTS; SEMICONDUCTING SILICON; SILICA; TEXTURES; VACUUM APPLICATIONS;

EID: 0030109550     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.579899     Document Type: Article
Times cited : (26)

References (17)
  • 13
    • 0003495856 scopus 로고
    • JCPDS International Center for Powder Diffraction Data, JCPDS, Swarthmore, PA, A1
    • Powder Diffraction File (JCPDS International Center for Powder Diffraction Data, JCPDS, Swarthmore, PA, 1989), A1 pp. 4-787.
    • (1989) Powder Diffraction File , pp. 4-787
  • 14
    • 85033859514 scopus 로고    scopus 로고
    • from the National Institute of Health, obtainable from public program site with access address "zippy.nimh.nih.gov" under the directory/pub/nih-image
    • IMAGE software, v.1.55, from the National Institute of Health, obtainable from public program site with access address "zippy.nimh.nih.gov" under the directory/pub/nih-image.
    • IMAGE Software, V.1.55


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.