Reliability and degradation behavior of a InGaAsP/InP waveguide photodiode for subscriber systems

Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Volumn , Issue , 1997, Pages 143-

  Mawatari, Hiroyasu ^a   Fukuda, Mitsuo ^a   Kato, Kazutoshi ^a   Kozen, Atsuo ^a   Yuda, Masahiro ^a   Takeshita, Tatsuya ^a   Uchida, Naoto ^a   Toba, Hiromu ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); PHOTODIODES; RELIABILITY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DIODES;

OPTICAL BEAM INDUCED CURRENT (OBIC); PLANAR LIGHTWAVE CIRCUIT (PLC);

OPTICAL WAVEGUIDES;

EID: 0030661330     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)