Microscopic reflection difference spectroscopy on semiconductor nanostructures

Physica Status Solidi (A) Applied Research

Volumn 170, Issue 2, 1998, Pages 307-315

  Koopmans, B ^a,c   Santos, P V ^b,c   Cardona, M ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; REFLECTION; SEMICONDUCTING ALUMINUM COMPOUNDS; SPECTROSCOPY;

MICROSCOPIC REFLECTION DIFFERENCE SPECTROSCOPY; SEMICONDUCTOR NANOSTRUCTURES; TIGHT BINDING CALCULATIONS;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032301748     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199812)170:2<307::AID-PSSA307>3.0.CO;2-Z     Document Type: Article

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