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Volumn 7, Issue 1, 1996, Pages 30-35

A high performance magnetic force microscope

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EID: 0041718882     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/1/004     Document Type: Article
Times cited : (9)

References (15)
  • 1
    • 4244085510 scopus 로고
    • Magnetic imaging by force microscopy with 1000 Å resolution
    • Martin Y and Wickramasinghe H K 1987 Magnetic imaging by force microscopy with 1000 Å resolution Appl. Phys. Lett. 50 1455-7
    • (1987) Appl. Phys. Lett. , vol.50 , pp. 1455-1457
    • Martin, Y.1    Wickramasinghe, H.K.2
  • 3
    • 33750306098 scopus 로고
    • Atomic force microscope - Force mapping and profiling on a sub 100 Å scale
    • Martin Y, Williams C C and Wickramasinghe H K 1987 Atomic force microscope - force mapping and profiling on a sub 100 Å scale J. Appl. Phys. 61 4723-9
    • (1987) J. Appl. Phys. , vol.61 , pp. 4723-4729
    • Martin, Y.1    Williams, C.C.2    Wickramasinghe, H.K.3
  • 5
    • 36549104996 scopus 로고
    • A differential interferometer for force microscopy
    • Schönenburger C and Alvarado S F 1989 A differential interferometer for force microscopy Rev. Sci. Instrum. 60 3131-4
    • (1989) Rev. Sci. Instrum. , vol.60 , pp. 3131-3134
    • Schönenburger, C.1    Alvarado, S.F.2
  • 6
    • 0028546404 scopus 로고
    • A differential interferometer for scanning force microscopy
    • Cunningham M J, Cheng S T and Clegg W W 1994 A differential interferometer for scanning force microscopy Meas. Sci. Technol. 5 1350-4
    • (1994) Meas. Sci. Technol. , vol.5 , pp. 1350-1354
    • Cunningham, M.J.1    Cheng, S.T.2    Clegg, W.W.3
  • 9
    • 0037712286 scopus 로고
    • Improved differential heterodyne interferometer for atomic force microscopy
    • Sasaki M, Hane K, Okuma S, Hino M and Bessho Y 1994 Improved differential heterodyne interferometer for atomic force microscopy Rev. Sci. Instrum. 65 3697-701
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 3697-3701
    • Sasaki, M.1    Hane, K.2    Okuma, S.3    Hino, M.4    Bessho, Y.5
  • 10
    • 3743052730 scopus 로고
    • A metrological constant force stylus profiler
    • Howard L P and Smith S T 1994 A metrological constant force stylus profiler Rev. Sci. Instrum. 65 892-902
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 892-902
    • Howard, L.P.1    Smith, S.T.2
  • 11
    • 85034735566 scopus 로고
    • Personal communication Division of Electrical Engineering, Victoria University of Manchester, Manchester, UK
    • Miles J J 1995 Personal communication Division of Electrical Engineering, Victoria University of Manchester, Manchester, UK
    • (1995)
    • Miles, J.J.1
  • 12
    • 0028550649 scopus 로고
    • Optimisation of thin film tips for magnetic force microscopy
    • Babcock K, Elings V, Dugas M and Loper S 1994 Optimisation of thin film tips for magnetic force microscopy IEEE. Trans. Magn. 30 4503-5
    • (1994) IEEE. Trans. Magn. , vol.30 , pp. 4503-4505
    • Babcock, K.1    Elings, V.2    Dugas, M.3    Loper, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.