Electron beam fabrication and characterization of high-resolution magnetic force microscopy tips

Journal of Applied Physics

Volumn 79, Issue 6, 1996, Pages 2913-2919

  Ruhrig M ^a,b   Porthun, S ^a   Lodder, J C ^a   McVitie, S ^b   Heyderman, L J ^b   Johnston, A B ^b   Chapman, J N ^b  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011932045     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361287     Document Type: Article

References (14)

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