Synchrotron X-ray microdiffraction measurements of lattice tilts within CVD diamond crystallites terminated by cathodoluminescent blue-cross-quartered cube facets

Diamond and Related Materials

Volumn 7, Issue 11-12, 1998, Pages 1698-1708

  Lang, A R ^a   Makepeace, A P W ^a   Butler, J E ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Characterization; Columnar growth; Diamond films; Lattice misorientations; Surface profilometry; X ray microdiffraction; X ray microradiography

Indexed keywords

CATHODOLUMINESCENCE; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL ORIENTATION; ELECTRON TUNNELING; SURFACE STRUCTURE; X RAY CRYSTALLOGRAPHY;

COLUMNAR GROWTH; LATTICE TILTS; SURFACE PROFILOMETRY; SYNCHROTRON X RAY MICRODIFFRACTION MEASUREMENT;

DIAMOND FILMS;

EID: 0032292426     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(98)00250-7     Document Type: Article

References (7)

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4. C.D.O. Pickard, T.J. Davis, W.N. Wang, J.W. Steeds, Diamond Relat. Mater. 7 (1998) 238-242.
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7. Diamond and Related Materials 7 (1998) 1709-1713