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Volumn 3, Issue 4, 1996, Pages 163-172
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Applications of synchrotron radiation to defect characterization and Pendellösung fringe-spacing measurement in a natural diamond
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Author keywords
Defects; Diamond; Pendell sung; Structure factor measurement; X ray refraction contrast; X ray topography
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Indexed keywords
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EID: 0030518911
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S0909049596004268 Document Type: Article |
Times cited : (7)
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References (19)
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