Combining optical microscopy, X-ray microradiography and X-ray topography in the study of individual CVD diamond crystallites

Diamond and Related Materials

Volumn 6, Issue 9, 1997, Pages 1226-1230

  Lang, A R ^a   Makepeace, A P W ^a   Martineau, P M ^b   Cooper, M A ^c  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b De Beers DTC Research Centre   (United Kingdom)

^c De Beers Group   (South Africa)

Author keywords

CVD diamond; Lattice perfection; X ray microradiography; X ray topography

Indexed keywords

EID: 0039612727     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(97)00026-5     Document Type: Article

References (8)

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3. A.R. Lang, X-ray topography, in: International Tables for Crystallography, Vol. C, Kluwer, Dordrecht, 1992, Chap. 2.7, p. 113.
4. H. Nakazawa, Y. Kanazawa, M. Kamo, K. Osumi, Thin Solid Films 151 (1987) 199-206.
5. D.R. Black, H. Burdette, paper 12.3, ICNDST-5, Tours, France, 8-13 Sept. 1996, Diamond Relat. Mater. 6 (1997) to be published.
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7. D.G. Coates, Phil. Mag. 16 (1967) 1179-1184.
8. D.J. Dingley, V. Randle, J. Mater. Sci. 27 (1992) 4545-4566.