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Volumn 13, Issue 12, 1998, Pages 1412-1417
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Variation of the effective extinction coefficient during pyrolytic and photo-assisted II-VI MOVPE growth, measured by in situ laser interferometry
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGRADATION;
DEPOSITION;
FILM GROWTH;
INTERFEROMETRY;
LASER APPLICATIONS;
METALLORGANIC VAPOR PHASE EPITAXY;
MIXTURES;
PYROLYSIS;
REFLECTOMETERS;
SEMICONDUCTOR GROWTH;
EFFECTIVE EXTINCTION COEFFICIENTS;
LASER INTERFEROMETRY;
LASER REFLECTOMETRY;
SEMICONDUCTOR MATERIALS;
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EID: 0032289258
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/13/12/014 Document Type: Article |
Times cited : (5)
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References (16)
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