Progress towards sub-micron hard x-ray imaging using elliptically bent mirrors and its applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3449, Issue , 1998, Pages 137-144

  MacDowell, A A ^a   Chang, C H ^a   Lamble, G M ^a   Celestre, R S ^a   Patel, J R ^a   Padmore, H A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Adaptive optics; Bent mirrors; Four crystal monochromator; Micro focusing; X ray; X ray absorption; X ray diffraction

Indexed keywords

ABSORPTION; ADAPTIVE OPTICS; CRYSTALS; FOCUSING; IMAGING TECHNIQUES; MIRRORS; MONOCHROMATORS; SPATIAL VARIABLES MEASUREMENT; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY;

BENT MIRRORS; X-RAY IMAGING;

X RAY DIFFRACTION;

EID: 0032224852     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.330341     Document Type: Conference Paper

References (17)

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7. Progress towards sub micron hard x-ray imagining using elliptically bend mirrors
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