Atomic force microscopy of platinum nanoparticles prepared on highly oriented pyrolytic graphite

Ultramicroscopy

Volumn 75, Issue 2, 1998, Pages 69-76

  Lee, Imshik ^a   Chan, Kwong Yu ^a   Phillips, David Lee ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Electrochemical deposition; Highly oriented pyrolytic graphite (HOPG); Platinum nanoparticles; Tapping mode atomic force microscopy (TMAFM)

Indexed keywords

CHARGE TRANSFER; DIFFUSION IN SOLIDS; ELECTRIC RESISTANCE; ELECTRODEPOSITION; ELECTROLYTES; GRAPHITE; INTERFACES (MATERIALS); MORPHOLOGY; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; PLATINUM;

HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); TAPPING MODE ATOMIC FORCE MICROSCOPY (TMAFM);

ATOMIC FORCE MICROSCOPY;

ELECTROLYTE; GRAPHITE; NANOPARTICLE; PLATINUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; DIFFUSION; ELECTROCHEMISTRY; ELECTRON TRANSPORT; PARTICLE SIZE;

EID: 0032213798     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00055-2     Document Type: Article

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