Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology

Microelectronics Reliability

Volumn 38, Issue 11, 1998, Pages 1733-1739

  Richier, C ^a   Maene, N ^b   Mabboux, G ^a   Bellens, R ^b  

^a STMICROELECTRONICS   (France)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC DISCHARGES; ELECTRIC SHIELDING; ELECTROSTATICS; LIGHT EMISSION; RELIABILITY; TRANSMISSION LINE THEORY; ZENER DIODES;

CHARGED DEVICE MODEL (CDM); ELECTROSTATIC DISCHARGE; HUMAN BODY MODEL (HBM);

CMOS INTEGRATED CIRCUITS;

EID: 0032206603     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00176-0     Document Type: Article

References (10)

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