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Volumn 7, Issue 6, 1998, Pages 1341-1346

Micro-temperature effects on absolute flatness test plates

Author keywords

[No Author keywords available]

Indexed keywords

FLATNESS ETALONS; MICRO-TEMPERATURE DEFORMATION;

EID: 0032205444     PISSN: 09639659     EISSN: None     Source Type: Journal    
DOI: 10.1088/0963-9659/7/6/012     Document Type: Article
Times cited : (15)

References (15)
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    • Dew, G.D.1
  • 2
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    • Interference bands and their applications
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  • 3
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    • Interferometric testing of smooth surfaces
    • ed E Wolf (Amsterdam: North-Holland)
    • Schulz G and Schwider J 1976 Interferometric testing of smooth surfaces Progress in Optics XIII ed E Wolf (Amsterdam: North-Holland) pp 94-167
    • (1976) Progress in Optics XIII , pp. 94-167
    • Schulz, G.1    Schwider, J.2
  • 4
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    • Removal of test optics errors
    • Parks R E 1978 Removal of test optics errors Proc. SPIE 153 56-63
    • (1978) Proc. SPIE , vol.153 , pp. 56-63
    • Parks, R.E.1
  • 5
    • 0021468527 scopus 로고
    • Absolute calibration of an optical flat
    • Fritz B S 1984 Absolute calibration of an optical flat Opt. Eng. 23 379-83
    • (1984) Opt. Eng. , vol.23 , pp. 379-383
    • Fritz, B.S.1
  • 6
    • 0000653677 scopus 로고
    • Absolute flatness testing by the rotation method with optimal measuring-error compensation
    • Schulz G and Grzanna J 1992 Absolute flatness testing by the rotation method with optimal measuring-error compensation Appl. Opt. 31 3767-80
    • (1992) Appl. Opt. , vol.31 , pp. 3767-3780
    • Schulz, G.1    Grzanna, J.2
  • 7
    • 0006572788 scopus 로고
    • Absolute flatness testing by an extended rotation method using two angles of rotation
    • Schulz G 1993 Absolute flatness testing by an extended rotation method using two angles of rotation Appl. Opt. 32 1055-9
    • (1993) Appl. Opt. , vol.32 , pp. 1055-1059
    • Schulz, G.1
  • 8
    • 0027653723 scopus 로고
    • Absolute testing of flats by using even and odd functions
    • Ai C and Wyant J C 1993 Absolute testing of flats by using even and odd functions Appl. Opt. 32 4698-705
    • (1993) Appl. Opt. , vol.32 , pp. 4698-4705
    • Ai, C.1    Wyant, J.C.2
  • 10
    • 0001065843 scopus 로고    scopus 로고
    • Test optics error removal
    • Evans C J and Kestner RN 1996 Test optics error removal Appl. Opt. 35 1015-21
    • (1996) Appl. Opt. , vol.35 , pp. 1015-1021
    • Evans, C.J.1    Kestner, R.N.2
  • 11
    • 0001088341 scopus 로고    scopus 로고
    • Large-aperture high-accuracy phase-shifting digital flat interferometer
    • Chen J, Song D, Zhu R, Wang Q and Chen L 1996 Large-aperture high-accuracy phase-shifting digital flat interferometer Opt. Eng. 35 1936-42
    • (1996) Opt. Eng. , vol.35 , pp. 1936-1942
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  • 12
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    • Interferometric testing of optical surfaces: Absolute measurement of flatness
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    • Hariharan, P.1
  • 13
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    • Newton, Fizeau, and Haidinger interferometers
    • ed D Malacara (New York: Wiley)
    • Mantravadi M V 1992 Newton, Fizeau, and Haidinger interferometers Optical Shop Testing ed D Malacara (New York: Wiley) pp 1-49
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    • Mantravadi, M.V.1
  • 14
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    • Phase shifting interferometry
    • ed D Malacara (New York: Wiley)
    • Greivenkamp E and Bruning J H 1992 Phase shifting interferometry Optical Shop Testing ed D Malacara (New York: Wiley) pp 501-98
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.