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Volumn 35, Issue 7, 1996, Pages 1936-1942

Large-aperture high-accuracy phase-shifting digital flat interferometer

Author keywords

Phase shifting interferometry; Plane standards

Indexed keywords


EID: 0001088341     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600627     Document Type: Article
Times cited : (20)

References (11)
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    • Wang, Q.1    Chan, J.2    Zhu, R.3    Chen, L.4    Zhang, Y.5
  • 3
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    • Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
    • M. Takeda, H. Ina, and S. Kobayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. 72, 156-160 (1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 156-160
    • Takeda, M.1    Ina, H.2    Kobayashi, S.3
  • 4
    • 0020940715 scopus 로고
    • Two dimension fringe-pattern analysis
    • W. W. Macy, Jr., "Two dimension fringe-pattern analysis," Appl. Opt. 22, 3898-3901 (1983).
    • (1983) Appl. Opt. , vol.22 , pp. 3898-3901
    • Macy Jr., W.W.1
  • 5
    • 18844434134 scopus 로고
    • New algorithm of phase shifting interferometry
    • R. Zhu, J. Chen, Q. Wang, and L. Chen, "New algorithm of phase shifting interferometry," Proc. SPIE 2003, 355-P366 (1993).
    • (1993) Proc. SPIE , vol.2003
    • Zhu, R.1    Chen, J.2    Wang, Q.3    Chen, L.4
  • 6
    • 0038888325 scopus 로고
    • Error sources in phase-measuring interferometry
    • K. Creath, "Error sources in phase-measuring interferometry," Proc. SPIE 1720, 428-435 (1992).
    • (1992) Proc. SPIE , vol.1720 , pp. 428-435
    • Creath, K.1
  • 7
    • 18844414819 scopus 로고
    • A spatial scanning method and fast Fourier transform algorithm for analyzing interferogram
    • C. Jinbang, Z. Jiazhen, S. Dezhen, and C. Xingming, "A spatial scanning method and fast Fourier transform algorithm for analyzing interferogram," Acta Arm. Sin. (2), 54-59 (1990).
    • (1990) Acta Arm. Sin. , Issue.2 , pp. 54-59
    • Jinbang, C.1    Jiazhen, Z.2    Dezhen, S.3    Xingming, C.4
  • 8
    • 0006714993 scopus 로고
    • Two dimension Fourier transform algorithm analyzing the interferogram and the fringe shift
    • J. Chen, R. Zhu, L. Liu, and D. Chen, "Two dimension Fourier transform algorithm analyzing the interferogram and the fringe shift," Proc. SPIE 1553, 616-625 (1991).
    • (1991) Proc. SPIE , vol.1553 , pp. 616-625
    • Chen, J.1    Zhu, R.2    Liu, L.3    Chen, D.4
  • 9
    • 0020844269 scopus 로고
    • Digital wavefront measuring interferometry: Some systematic error sources
    • J. Schwider, R. Burow, K. E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merke), "Digital wavefront measuring interferometry: some systematic error sources," Appl. Opt. 22, 3421-3432 (1983).
    • (1983) Appl. Opt. , vol.22 , pp. 3421-3432
    • Schwider, J.1    Burow, R.2    Elssner, K.E.3    Grzanna, J.4    Spolaczyk, R.5    Merke, K.6
  • 10
    • 84975625453 scopus 로고
    • Phase shifting interferometry: Reference phase error reduction
    • J. Schwider "Phase shifting interferometry: reference phase error reduction," Appl. Opt. 28, 3889-3892 (1989).
    • (1989) Appl. Opt. , vol.28 , pp. 3889-3892
    • Schwider, J.1
  • 11
    • 84975581085 scopus 로고
    • Fizeau interferometer for measuring flatness of optical surface
    • R. Bunnagel, H. A. Oechring, and K. Steiner, "Fizeau interferometer for measuring flatness of optical surface," Appl. Opt. 7, 331-335 (1968).
    • (1968) Appl. Opt. , vol.7 , pp. 331-335
    • Bunnagel, R.1    Oechring, H.A.2    Steiner, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.