X-ray microbeam quantification of grain subdivision accompanying large deformations of copper

Acta Materialia

Volumn 46, Issue 18, 1998, Pages 6599-6604

  Guvenilir, A ^a,c   Butler, G C ^b   Haase, J D ^a   Mcdowell, D L ^a,b   Stock, S R ^a  

^a Georgia Institute of Technology   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DEFORMATION; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; SYNCHROTRON RADIATION; TEXTURES; X RAY DIFFRACTION ANALYSIS;

X RAY MICROBEAM DIFFRACTION;

COPPER;

EID: 0032203205     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00298-5     Document Type: Article

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