메뉴 건너뛰기




Volumn 84, Issue 7, 1998, Pages 3491-3499

Heat source distribution, vertical structure, and coating influences on the temperature of operating 0.98 μm laser diodes: Photothermal reflectance measurements

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; CALCULATIONS; COATINGS; ELECTROOPTICAL EFFECTS; EQUATIONS OF STATE; LASER RESONATORS; LIGHT ABSORPTION; OPTICAL MICROSCOPY; REFLECTOMETERS; TEMPERATURE DISTRIBUTION; THERMAL DIFFUSION; THERMAL EFFECTS;

EID: 0032184633     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368524     Document Type: Article
Times cited : (9)

References (13)
  • 7
    • 0001617216 scopus 로고
    • Thermal wave characterization and inspection of semiconductor materials and devices
    • edited by A. Mandelis North-Holland, New York
    • A. Rosencwaig, ''Thermal wave characterization and inspection of semiconductor materials and devices,'' in Photoacoustic and Thermal Wave Phenomena in Semiconductors, edited by A. Mandelis (North-Holland, New York, 1987), pp. 97-135.
    • (1987) Photoacoustic and Thermal Wave Phenomena in Semiconductors , pp. 97-135
    • Rosencwaig, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.