Thermal stability of ohmic contacts to InN

Solid-State Electronics

Volumn 42, Issue 10, 1998, Pages 1831-1833

  Donovan, S M ^a   Mackenzie, J D ^a   Abernathy, C R ^a   Pearton, S J ^a   Ren, F ^b   Jones, K ^c   Cole, M ^c  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC RESISTANCE; SEMICONDUCTING INDIUM COMPOUNDS; THERMODYNAMIC STABILITY;

INDIUM NITRIDE;

OHMIC CONTACTS;

EID: 0032184368     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00144-0     Document Type: Article

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