Measurement and modeling of si integrated inductors

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 5, 1998, Pages 1372-1378

  Arcioni, Paolo ^a   Castello, Rinaldo ^a   De Astis, Giuseppe ^b   Sacchi, Enrico ^a   Svelto, Francesco ^c  

^a UNIVERSITY OF PAVIA   (Italy)

^b Atmel ES2   (France)

^c UNIVERSITY OF BERGAMO   (Italy)

Author keywords

De embedding; Equivalent circuit; Fitting procedure; Quality factor; Silicon integrated inductors

Indexed keywords

EQUIVALENT CIRCUITS; INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS; SILICON WAFERS;

SPIRAL INTEGRATED INDUCTORS;

ELECTRIC INDUCTORS;

EID: 0032179319     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.746613     Document Type: Article

References (7)

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