Characterization of the low magnification performance of a Philips CM300-FEG

Ultramicroscopy

Volumn 74, Issue 4, 1998, Pages 209-220

  Cheng, Yifan ^a   Taylor, Kenneth A ^b  

^a ADVANCED TELECOMMUNICATIONS RESEARCH INSTITUTE INTERNATIONAL   (Japan)

^b FLORIDA STATE UNIVERSITY   (United States)

Author keywords

Electron sources; HRTEM; HVEM; Image detectors

Indexed keywords

CARBON; COPPER COMPOUNDS; CRYSTAL LATTICES; ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRON SOURCES; GOLD; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE RECORDING; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS;

COPPER CHLOROPHTHALOCYANINE; IMAGE DETECTORS;

TRANSMISSION ELECTRON MICROSCOPY;

ARTICLE; DIFFRACTION; IMAGE PROCESSING; OPTICS; TRANSMISSION ELECTRON MICROSCOPY;

CARBON; CRYSTALLOGRAPHY; GOLD; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ELECTRON; PROTEINS; RADIATION TOLERANCE; TOMOGRAPHY;

EID: 0032171157     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00039-4     Document Type: Article

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