Extraction of the threshold voltage of MOSFETs: An overview

Proceedings of the IEEE Hong Kong Electron Devices Meeting

Volumn , Issue , 1997, Pages 31-38

  Liou, J J ^a   Ortiz Conde, A ^a   Garcia Sanchez, F ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE MANUFACTURE;

LINEAR EXTRAPOLATION METHOD; THRESHOLD VOLTAGE;

MOSFET DEVICES;

EID: 0031358395     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)