Polarization crosstalk dependence on length in silica-based waveguides measured by using optical low coherence interference

Journal of Lightwave Technology

Volumn 16, Issue 8, 1998, Pages 1413-1422

  Takada, K ^a   Mitachi, S ^b  

^a NTT CORPORATION   (Japan)

^b NONE

Author keywords

Mode coupling; Optical interferometry; Optical planar waveguide; Optical polarization; Polarization crosstalk

Indexed keywords

BIREFRINGENCE; CROSSTALK; INTEGRATION; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT POLARIZATION; MEASUREMENT ERRORS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; SILICA;

MODE COUPLING; POLARIZATION CROSSTALK; SILICA BASED WAVEGUIDES;

OPTICAL WAVEGUIDES;

EID: 0032140191     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.704607     Document Type: Article

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