Rayleigh backscattering measurement of 10m long silica-based waveguides

Electronics Letters

Volumn 32, Issue 18, 1996, Pages 1665-1667

  Takada, K ^a   Yamada, H ^a   Hida, Y ^a   Ohmori, Y ^a   Mitachi, S ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Optical waveguides; OTDR; Rayleigh scattering

Indexed keywords

ELECTRIC LOSSES; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTRON DEVICE MANUFACTURE; RAYLEIGH SCATTERING; REFLECTOMETERS; SILICA; SUBSTRATES;

OPTICAL MATRIX SWITCHES; PLANAR LIGHTWAVE CIRCUIT; RANGE EXTENDED OPTICAL LOW COHERENCE REFLECTOMETER; RAYLEIGH BACKSCATTERING MEASUREMENT;

OPTICAL WAVEGUIDES;

EID: 0030219002     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19961118     Document Type: Article

References (3)

1. OKUNO, M., KATO, K., OHMORI, Y., and MATSUNAGA, T.: 'Improved 8×8 integrated optic matrix switch using silica-based planar lightwave circuits', J. Lightwave Technol., 1994, 12, (9), pp. 1597-1606
2. HIDA, Y., HIBINO, Y., OKAZAKI, H., and OHMORI, Y.: '10m long silica-based waveguide with a loss of 1.7dB/m', Proc. Integrated Photonics Research Conf., 1995, Paper IThC6-l, pp. 49-51
3. TAKADA, K., YAMADA, Y., HIBINO, Y., and MITACHI, S.: 'Range extension in optical low coherence reflectometry achieved by using a pair of retroreflectors', Electron. Lett., 1995, 31, pp. 1565-1566