Optical low coherence method for characterizing silica-based arrayed-waveguide grating multiplexers

Journal of Lightwave Technology

Volumn 14, Issue 7, 1996, Pages 1677-1689

  Takada, Kazumasa ^a,b,c,d,e   Yamada, Hiroaki ^a,b,e,f   Inoue, Yasunori ^a,b,e,g,h  

^a NTT CORPORATION   (Japan)

^b Saitama Prefecture ^*

^c SAITAMA UNIVERSITY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^f Osaka Prefecture University   (Japan)

^g KYUSHU UNIVERSITY   (Japan)

^h IEEE

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK; DIFFRACTION GRATINGS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GEOMETRICAL OPTICS; INTERFEROMETERS; LIGHT SOURCES; MIRRORS; MULTIPLEXING EQUIPMENT; OPTICAL FIBERS; OPTICAL WAVEGUIDES; SILICA; WAVEGUIDE COMPONENTS;

CHANNEL CROSSTALK; CHANNEL SPACINGS; GEOMETRICAL STEP INCREMENT; OPTICAL LOW COHERENCE METHOD; OPTICAL PHASE ERRORS; POWER DISTRIBUTION COEFFICIENTS; SILICA BASED ARRAYED WAVEGUIDE GRATING MULTIPLEXERS;

COHERENT LIGHT;

EID: 0030190123     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.507944     Document Type: Article

References (11)

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