Circuit analysis of an ultrafast junction mixing scanning tunneling microscope

IEEE Journal of Quantum Electronics

Volumn 34, Issue 8, 1998, Pages 1415-1418

  Steeves, G M ^a   Elezzabi, A Y ^a   Teshima, R ^a   Said, R A ^b   Freeman, M R ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNITED ARAB EMIRATES UNIVERSITY   (United Arab Emirates)

Author keywords

Circuit modeline; Junction mixing; Microscopy; Scanning tunneling microscopy; Time resolved; Tunneling; Ultrafast electronics; Ultrafast optics

Indexed keywords

CAPACITANCE; ELECTRIC NETWORK ANALYSIS; LUMPED PARAMETER NETWORKS; MATHEMATICAL MODELS; TUNNEL JUNCTIONS; ULTRAFAST PHENOMENA;

JUNCTION MIXING SCANNING TUNNELING MICROSCOPES (JM STM);

SCANNING TUNNELING MICROSCOPY;

EID: 0032139527     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.704332     Document Type: Article

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