Quantifying the information content of surface plasmon resonance reflection spectra

Sensors and Actuators, B: Chemical

Volumn 51, Issue 1-3, 1998, Pages 321-330

  Chinowsky, Timothy M ^a   Yee, Sinclair S ^a  

^a University of Washington   (United States)

Author keywords

Linear estimation; Noise; Refractometry; Surface plasmon resonance

Indexed keywords

MATHEMATICAL MODELS; NUMERICAL METHODS; PLASMAS; REAL TIME SYSTEMS; REFRACTIVE INDEX; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; THICKNESS MEASUREMENT; THIN FILM DEVICES;

LINEAR ESTIMATION; SURFACE PLASMON RESONANCE REFLECTION SPECTRA;

REFRACTOMETERS;

EID: 0032130925     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(98)00207-X     Document Type: Article

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