Plan-view and cross-sectional tem observations of interfacial reactions and fractal formation in a-Ge/Au films

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 78, Issue 1, 1998, Pages 157-170

  Bian, Bo ^a   Tanaka, Tomoya ^b   Ohkubo, Tadakatsu ^a   Hirotsu, Yoshihiko ^a  

^a OSAKA UNIVERSITY   (Japan)

^b PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032128665     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/014186198253732     Document Type: Article

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