Kinetics of grain-boundary reactions at semimetal-semiconductor interfaces observed during in-situ transmission electron microscope annealing

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 74, Issue 4, 1996, Pages 907-918

  Petford Long, Amanda K ^a   Doole, R C ^a   Afonso, C N ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b INSTITUTO DE ÓPTICA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030268003     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619608242167     Document Type: Article

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