Algebraic test-pattern generation based on the Reed-Muller spectrum

IEE Proceedings: Computers and Digital Techniques

Volumn 145, Issue 4, 1998, Pages 308-316

  Gil, C ^a   Ortega, J ^b  

^a UNIVERSITY OF ALMERÍA   (Spain)

^b UNIVERSITY OF GRANADA   (Spain)

Author keywords

Boolean testing; Digital spectral techniques; Rccil mullcr spectrum; Testing digital circuits

Indexed keywords

BENCHMARKING; BOOLEAN ALGEBRA; BUILT-IN SELF TEST; COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; SPECTRUM ANALYSIS; SWITCHING FUNCTIONS;

BENCHMARK CIRCUITS; DIGITAL SPECTRAL TECHNIQUE; REED-MULLER SPECTRUM; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0032119821     PISSN: 13502387     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cdt:19982024     Document Type: Article

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