Test Pattern Generation Using Boolean Satisfiability

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 11, Issue 1, 1992, Pages 4-15

  Larrabee, Tracy ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC CIRCUITS, COMBINATORIAL--TESTING;

BOOLEAN SATISFIABILITY ALGORITHMS; TEST PATTERN GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0026623575     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/43.108614     Document Type: Article

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