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Volumn 15, Issue 3, 1998, Pages 58-63

Design of cache test hardware on the HP PA8500

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER STORAGE; COMPUTER HARDWARE; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING;

EID: 0032115192     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.706034     Document Type: Article
Times cited : (9)

References (8)
  • 1
    • 0029516850 scopus 로고    scopus 로고
    • Testability, Debuggability, and Manufacturability Features of the UltraSPARC-1 Microprocessor
    • IEEE Computer Society Press, Los Alamitos, Calif.
    • M. Levitt et al., "Testability, Debuggability, and Manufacturability Features of the UltraSPARC-1 Microprocessor," Proc. 1995 IEEE Int'l Test Conf., IEEE Computer Society Press, Los Alamitos, Calif., pp. 157-166.
    • Proc. 1995 IEEE Int'l Test Conf. , pp. 157-166
    • Levitt, M.1
  • 2
    • 0027553221 scopus 로고
    • Using March Tests to Test SRAMs
    • Mar.
    • A.J. van de Goor, "Using March Tests to Test SRAMs," IEEE Design & Test of Computers, Vol. 1, No. 1, Mar. 1993, pp. 8-14.
    • (1993) IEEE Design & Test of Computers , vol.1 , Issue.1 , pp. 8-14
    • Van De Goor, A.J.1
  • 3
    • 0029712826 scopus 로고    scopus 로고
    • March LR: A Test for Realistic Linked Faults
    • IEEE CS Press
    • A.J. van de Goor et al., "March LR: A Test for Realistic Linked Faults," Proc. IEEE 14th VLSI Test Symp., IEEE CS Press, pp. 272-280.
    • Proc. IEEE 14th VLSI Test Symp. , pp. 272-280
    • Van De Goor, A.J.1
  • 6
    • 0024663206 scopus 로고
    • Random Pattern Testing Versus Deterministic Testing of RAMs
    • May
    • R. David, A. Fuentes, and B. Courtois, "Random Pattern Testing Versus Deterministic Testing of RAMs," IEEE Trans. Computers, Vol. 38, No. 5, May 1989, pp. 637-650.
    • (1989) IEEE Trans. Computers , vol.38 , Issue.5 , pp. 637-650
    • David, R.1    Fuentes, A.2    Courtois, B.3
  • 7
    • 0025232232 scopus 로고
    • Pseudorandom Built-In Self-Test Methodology and Implementation for the IBM RISC System/6000 Processor
    • Jan.
    • I.M. Ratiu and H.B. Bakoglu, "Pseudorandom Built-In Self-Test Methodology and Implementation for the IBM RISC System/6000 Processor," IBM J. Research and Development, Vol. 34,No. 1, Jan. 1990, pp. 78-84.
    • (1990) IBM J. Research and Development , vol.34 , Issue.1 , pp. 78-84
    • Ratiu, I.M.1    Bakoglu, H.B.2
  • 8
    • 3242755402 scopus 로고    scopus 로고
    • PA-8500: The Continuing Evolution of the PA-8000 Family
    • addendum IEEE CS Press
    • G. Lesartre and D. Hunt, "PA-8500: The Continuing Evolution of the PA-8000 Family," addendum to Proc. CompCon 97, IEEE CS Press.
    • Proc. CompCon 97
    • Lesartre, G.1    Hunt, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.