Testability, debuggability, and manufacturability features of the ultraSPARC-I microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 157-166

  Levitt, Marc E ^a   Nori, Srinivas ^a   Narayanan, Sridhar ^a   Grewal, G P ^a   Youngs, Lynn ^a   Jones, Anjali ^a   Billus, Greg ^a   Paramanandam, Siva ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER DEBUGGING; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; PIPELINE PROCESSING SYSTEMS; PRODUCT DESIGN; PROGRAM COMPILERS;

MANUFACTURABILITY; PROCESSOR DEBUGGABILITY; PROCESSOR TESTABILITY; TIME TO VOLUME GOALS;

MICROPROCESSOR CHIPS;

EID: 0029516850     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)