Very large arrays of flip-chip bonded 1.55 μm photodetectors

Journal of Lightwave Technology

Volumn 16, Issue 6, 1998, Pages 1056-1060

  Goossen, Keith W ^a,b   Cunningham, J E ^a   Zhang, G ^a   Walker, J A ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b IEEE   (United States)

Author keywords

Arrays; CMOS integrated circuits; Crystal growth; Flip chip devices; Integrated optoelectronics; p i n photodiodes; Redundancy; Spectroscopy

Indexed keywords

CMOS INTEGRATED CIRCUITS; CRYSTAL GROWTH; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; FLIP CHIP DEVICES; INTEGRATED OPTOELECTRONICS; LEAKAGE CURRENTS; PHOTODIODES; POINT DEFECTS; SEMICONDUCTING INDIUM PHOSPHIDE;

FLIP CHIP BONDED PHOTODETECTORS;

PHOTODETECTORS;

EID: 0032100006     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.681463     Document Type: Article

References (8)

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