Measurement of two particle resolution in silicon drift detectors

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 1, 1998, Pages 315-321

  Pandey, S U ^a   Bellwied, R ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CHARGED PARTICLES; COLLIDING BEAM ACCELERATORS; CORRELATION METHODS; ELECTRONS; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; PULSED LASER APPLICATIONS; SILICON WAFERS;

DRIFT; ELECTRON CLOUDS; GAUSSIAN DISTRIBUTION; SILICON DRIFT DETECTORS; TWO PARTICLE RESOLUTION;

PARTICLE DETECTORS;

EID: 0032098868     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.682400     Document Type: Article

References (11)

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