Double particle resolution measured in a silicon drift chamber

Nuclear Inst. and Methods in Physics Research, A

Volumn 316, Issue 2-3, 1992, Pages 283-288

  Clemen, Mark ^a   Humanic, T ^f   Kraus, D ^f   Vilkelis, G ^f   Rehak, P ^b   Holl, P ^c   Gatti, E ^d   Sampietro, M ^d   Kemmer, J ^e  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^d POLITECNICO DI MILANO   (Italy)

^e TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^f NONE

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION DETECTORS;

DRIFT CHAMBERS; POSITION MEASURING DEVICES; SILICON DRIFT CHAMBERS;

PARTICLE DETECTORS;

EID: 0026883125     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(92)90911-M     Document Type: Article

References (8)

1. Semiconductor drift chamber — An application of a novel charge transport scheme
2. Semiconductor drift chambers for position and energy measurements